-
Published20/05/2011
-
Deadline08/07/2011
-
Awarded22/08/2011
-
Today10/06/2026
Utilities
- indicates text translated automatically in your browsing language
D-Munich: industrial machinery
To analyse thin film heterostructures with regard to structural parameters such as grille parameters, composition, elaxation effects, layer thickness, coating roughness, structural perfection and layer homogeneity, we plan to procure a new high resolution x-ray diffuseractometer. The variation of these structural parameters shall be analysed over wafers up to 100 mm diameter. The calibration of samples, measurement processes and evaluations must be rapid, accurate and highly automated.
This content published on this page is meant purely as an additional service and has no legal effect. The Union's institutions do not assume any liability for its contents. The official versions of the relevant tendering notices are those published in the Supplement of Official Journal of the European Union and available in TED. Those official texts are directly accessible through the links embedded in this page. For more information please see Public Procurement Explainability and Liability notice.