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Published11/08/2011
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Deadline25/08/2011
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Awarded13/10/2011
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Today19/07/2026
Utilities
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D-Eggenstein-Leopoldshafen: spectrometers
The preparation and characterisation of thin epitactic oxide layers has long been an important topic of research at the Institute of Solid Physics. In particular, transitional metal oxides, which show different regulatory structures (superconduction, ferro-/antiferromagnetism, ferro-electricity) and can be significantly modified by borderline effects, offer new potential for application. However, the preparation and characterisation of oxidised surfaces and layer structures is an enormous experimental challenge.
In order to better characterise the structural characteristics of thin layers, provision is therefore made for the purchase of a high-resolution X-ray dractometer.
This thin-film x-ray dractometer provides not only the standard measurement methods for characterisation of symmetrical diffraction reflexes and the mosaic distribution (Theta/2Theta and Omega scans), but also high resolution measurements of asymmetric diffraction reflexes in the room (HRXRD/RSM). Such measurements are essential to accurately characterise the epitactic tension. In addition, reflective measurements (XRRs) are also provided to characterise the thickness of the layer and the surface/limit surface roughness. In order to characterise the plan Grid constant, measurements under ribbon intrusion are desirable (GID).
The notice involves a public contract
38580000 - Non-medical equipment based on the use of radiations
Postal address: Östliche Rheinbrückenstr. 49
Town: Karlsruhe
Postal code: 76187
Country: DEU
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