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Published28/08/2019
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Deadline25/09/2019
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Opening of tenders25/09/2019
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Awarded18/12/2019
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Today18/09/2026
Utilities
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France-Grenoble: Document creation, drawing, imaging, scheduling and productivity software package
As part of its research and development activities on micro- and nanotechnology, CEA-LETI wishes to acquire licences for contour detection and metrology software on images of electron microscopy. Contour detection must be accurate and robust to the various SEM imaging artefacts (noise, loading, resolution). The associated metrology must make it possible to diagnose the dimensional characteristics of different microelectronics patterns, such as contacts, lines/spaces or curvilineary patterns. The software must also be capable of quantitatively comparing lithographic patterns with data references.
https://www.marches-publics.gouv.fr
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