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Published20/06/2025
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Today20/07/2025
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Deadline21/07/2025
Utilities
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Scanning Electron Microscopy (SEM) Text automatically translated in your browsing language Automatically translated
The Institute of Physics and Materials Sciences at BOKU Vienna is planning to purchase a scanning electron microscope (REM) for use in ultra-high-cyclic fatigue tests (UHF). Associated with this are variable ambient conditions for samples to operate, including high vacuum, low vacuum (up to 2600 Pa H2O or 4000 Pa N2). High resolution (e.g. 1.0 nm at 30 kV SE in high vacuum and 1.3 nm at 30 kV SE in low vacuum or ESEM mode). Additional functions are especially low vacuum mode, SE, BSE, EDX, EBSD, chamber size). Adaptation options of the chamber and its door to meet the special requirements for carrying out the UHF sample setups Text automatically translated in your browsing language Automatically translated
https://boku.vergabeportal.at/Detail/217555
https://boku.vergabeportal.at/Detail/217555
38000000 - Laboratory, optical and precision equipments (excl. glasses)
38511000 - Electron microscopes CVP code deduced from the text of the procedure AI-generated
38510000 - Microscopes CVP code deduced from the text of the procedure AI-generated
38500000 - Checking and testing apparatus CVP code deduced from the text of the procedure AI-generated
Type: quality
Description: Technische Funktionalität
Weight (percentage, exact): 50
Criterion:
Type: price
Description: Auftragsentgelt
Weight (percentage, exact): 50
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