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Published10/03/2025
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Deadline08/04/2025
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Canceled27/06/2025
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Today02/07/2025
Utilities
- indicates CPV codes deduced from the text of the procedure
- indicates text translated automatically in your browsing language
Wafer tester Text automatically translated in your browsing language Automatically translated
The subject of this procedure is the supply and installation of a fully automatic 200 mm wafer sampler. The wafer sampler must be designed for continuous operation and should have advanced wafer and cassette handling capabilities to accommodate multiple wafers to significantly increase throughput. This test station shall be optimized for instrument characterization, electrical reliability testing and special production applications, and shall enable precise electrical measurements over extremely low-noise, DC, RF, mmW and THz frequencies. Text automatically translated in your browsing language Automatically translated
https://www.dtvp.de/Satellite/notice/CXP4YWL50AX
https://www.dtvp.de/Satellite/notice/CXP4YWL50AX
31712000 - Microelectronic machinery and apparatus and microsystems
31712100 - Microelectronic machinery and apparatus
38000000 - Laboratory, optical and precision equipments (excl. glasses) CVP code deduced from the text of the procedure AI-generated
Type: price
Description: Preis
Weight (percentage, exact): 50.0
Criterion: Technik/Qualität
Type: quality
Description: Erfüllung der B-Kriterien
Weight (percentage, exact): 30.0
Criterion: Lieferzeitpunkt
Type: quality
Description: Lieferzeitpunkt: 5 Monate oder weniger
Weight (percentage, exact): 10.0
Criterion: Wartungskonzept
Type: quality
Description: Wartungskonzept
Weight (percentage, exact): 5.0
Criterion: Gewährleistung
Type: quality
Description: Auswertung der Gewährleistungszeit gemäß dem Leistungsverzeichnis
Weight (percentage, exact): 5.0
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