UK-Swindon: Rasterelektronenmikroskope

Scanning electron microscopes. The Authority has a requirement for a scanning electron microscope which has the following core essential criteria:
(1) Non diffusion-pumped vacuum system (turbo-molecular preferred) backed by a rotary pump;
(2) High Vacuum and Variable pressure operation. Variable pressure range from 1 to 400 Pa.;
(3) Chamber size to allow for specimens of around 100mm in height and 200mm in diameter;
(4) Image resolution 4nm or better @ 30kV;
(5) Image resolution 20nm or better @ 1kV;
(6) Low end magnification X10 or less;
(7) High end magnification X500,000 or more;
(8) Secondary electrons (SE) specimen topography detection incorporated;
(9) Backscattered electrons (BSE) chemical composition contrast detection incorporated;
(10) Motorised 5 axis stage;
(11) Dual channel operation;
(12) Liquid Nitrogen (LN)-free cryogenic cooling;
(13) Delivery, installation, commissioning and on site training;
(14) 5-year through life support (first year covered by manufacturers warranty); a minimum of one site maintenance visit per year.
Hardware:
1. Tungsten emission system, variable pressure air admittance to 400 Pa, 5-axis motorised stage with software joystick;
2. Two 17" or better High contrast, colour flat panels;
3. Dual Joystick control device for manual control of motorised stage;
4. Lens Mounted five segment advanced silicon diode backscatter detector, sensitive to 1keV;
5. Dual channel operation which allows the user to display 2 live electron detector images at 1 024 x 768 pixel resolution on to 2 separate screens simultaneously;
6. Chamberscope with infrared (IR) illumination displayed to full screen;
7. Centre feature & centre point stage.
The following are highly desirable options:
1. Energy-dispersive X-ray spectroscopy (EDX) elemental analysis detection incorporated, energy resolution of 133eV or better with Silicon drift detector (SDD) non-cryogenic detector with:
(a) Point analysis;
(b) Line scan analysis;
(c) Area scan analysis;
(d) Area mapping of distributions and inclusions.
Qualitative and quantitative output (e) EDX Microanalysis System.
2. Electron backscatter diffraction (EBSD);
3. Wavelength dispersive X-ray spectroscopy (WDX) Companies must also confirm that they hold, or are working toward third party accreditation to ISO 9001:2008 and ISO 15632:2002 and provide a copy of the same, which must also include the scope of accreditation and must also include coverage of the capability which is the subject of this advert. A pre qualification questionnaire may be required though the Authority reserves the right to proceed to the invitation to tender stage without conducting a PQQ. Companies that wish to express an interest in this requirement are required to provide their full company name, postal address, contact name, telephone number and e-mail address.

38511100 - Rasterelektronenmikroskope